Tibor Grasser

Electrical and Electronic Engineering · 2007–2021

A researcher in the Science corpus: 13 papers; trusts 12 researchers and is trusted by 15 researchers here, as inferred from the citation graph.

Subfields

Whom Tibor Grasser trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Ben Kaczer
  2. Hans Reisinger
  3. P. Blöchl
  4. Souvik Mahapatra
  5. A. E. Islam
  6. Dieter K. Schroder
  7. Asen Asenov
  8. Haldun Kufluoglu
  9. M. A. Alam
  10. Wolfgang Gustin

Who trusts Tibor Grasser overall

  1. Souvik Mahapatra
  2. Ben Kaczer
  3. Hans Reisinger
  4. Nilesh Goel
  5. D. Fleetwood
  6. Thomas Aichinger
  7. S. Desai
  8. Wolfgang Goes
  9. Wolfgang Gustin
  10. Shashank Gupta

Papers from Tibor Grasser's perspective

Ordered by how strongly the researchers Tibor Grasser trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)
  2. Characterization and Physical Origin of Fast Vth Transient in NBTI of pMOSFETs with SiON Dielectric (International Electron Devices Meeting)
  3. AC NBTI studied in the 1 Hz -- 2 GHz range on dedicated on-chip CMOS circuits (International Electron Devices Meeting)
  4. Material dependence of hydrogen diffusion: implications for NBTI degradation (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
  5. RTS amplitudes in decananometer MOSFETs: 3-D simulation study
  6. A critical examination of the mechanics of dynamic NBTI for PMOSFETs (IEEE International Electron Devices Meeting 2003)
  7. On the Physical Mechanism of NBTI in Silicon Oxynitride p-MOSFETs: Can Differences in Insulator Processing Conditions Resolve the Interface Trap Generation versus Hole Trapping Controversy? (2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual)
  8. The Universality of NBTI Relaxation and its Implications for Modeling and Characterization (2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual)
  9. A two-stage model for negative bias temperature instability (IEEE International Reliability Physics Symposium)
  10. Two independent components modeling for Negative Bias Temperature Instability (IEEE International Reliability Physics Symposium)

Their papers