The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

By Tibor Grasser, Ben Kaczer, Wolfgang Goes, Hans Reisinger, Thomas Aichinger, Philipp Hehenberger, P. Wagner, F. Schanovsky, J. Franco, M. Luque and 1 more. IEEE Transactions on Electron Devices, 2011

460 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/c613fc9a9029dcad504e6713ab5d49e9c53656f7