D. Fleetwood

Electrical and Electronic Engineering · 2002–2018

A researcher in the Science corpus: 11 papers; trusts 18 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom D. Fleetwood trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. John Robertson
  2. Paul E. Dodd
  3. J. Schwank
  4. Hugh J. Barnaby
  5. M. Shaneyfelt
  6. R. Lacoe
  7. H. Hughes
  8. J. Felix
  9. G. Wilk
  10. Tibor Grasser

Who trusts D. Fleetwood overall

  1. Hugh J. Barnaby
  2. Tibor Grasser

Papers from D. Fleetwood's perspective

Ordered by how strongly the researchers D. Fleetwood trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Cramming More Components Onto Integrated Circuits
  2. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
  3. Production and propagation of single-event transients in high-speed digital logic ICs (IEEE Transactions on Nuclear Science)
  4. Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM (IEEE Transactions on Nuclear Science)
  5. New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening (IEEE Transactions on Nuclear Science)
  6. Improving Integrated Circuit Performance Through the Application of Hardness-by-Design Methodology (IEEE Transactions on Nuclear Science)
  7. Radiation effects in SOI technologies
  8. Radiation Effects in MOS Oxides (IEEE Transactions on Nuclear Science)
  9. Radiation-induced edge effects in deep submicron CMOS transistors (IEEE Transactions on Nuclear Science)
  10. Soft Error Susceptibilities of 22 nm Tri-Gate Devices (IEEE Transactions on Nuclear Science)

Their papers