A. E. Islam

Electrical and Electronic Engineering · 2007–2013

A researcher in the Science corpus: 2 papers; trusts 3 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom A. E. Islam trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Ben Kaczer
  2. Hans Reisinger
  3. M. A. Alam
  4. Souvik Mahapatra

Who trusts A. E. Islam overall

  1. Tibor Grasser
  2. Souvik Mahapatra
  3. Ben Kaczer

Papers from A. E. Islam's perspective

Ordered by how strongly the researchers A. E. Islam trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)
  2. Material dependence of hydrogen diffusion: implications for NBTI degradation (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
  3. Characterization and Physical Origin of Fast Vth Transient in NBTI of pMOSFETs with SiON Dielectric (International Electron Devices Meeting)
  4. A comprehensive framework for predictive modeling of negative bias temperature instability (2004 IEEE International Reliability Physics Symposium. Proceedings)
  5. On the Physical Mechanism of NBTI in Silicon Oxynitride p-MOSFETs: Can Differences in Insulator Processing Conditions Resolve the Interface Trap Generation versus Hole Trapping Controversy? (2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual)
  6. Universal recovery behavior of negative bias temperature instability [PMOSFETs] (IEEE International Electron Devices Meeting 2003)
  7. AC NBTI studied in the 1 Hz -- 2 GHz range on dedicated on-chip CMOS circuits (International Electron Devices Meeting)
  8. The statistical analysis of individual defects constituting NBTI and its implications for modeling DC- and AC-stress (IEEE International Reliability Physics Symposium)
  9. A two-stage model for negative bias temperature instability (IEEE International Reliability Physics Symposium)
  10. Two independent components modeling for Negative Bias Temperature Instability (IEEE International Reliability Physics Symposium)

Their papers