A two-stage model for negative bias temperature instability

By Tibor Grasser, Ben Kaczer, Wolfgang Goes, Thomas Aichinger, Philipp Hehenberger, Michael Nelhiebel. IEEE International Reliability Physics Symposium, 2009

222 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/0b8ecf669d60c0cef8c4b092e689bdd4034ca1a8

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Tibor Grasser
2. Souvik Mahapatra
3. Hans Reisinger
4. M. A. Alam
5. Thomas Aichinger
6. A. E. Islam
7. Ben Kaczer
8. Shashank Gupta

In Materials Chemistry

1. Tibor Grasser

Citations in the corpus

• A Comparative Study of Different Physics-Based NBTI Models (2013, methodology): “2(a) shows the schematic description of the two-stage or four-energy-well model [46], [47].”
• The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps (2011, methodology): “the properties of these discrete steps are fully consistent with charge trapping observed in the context of random telegraph noise (RTN) and 1/f noise [21], [24]–[27], [43], [45]–[48].”