Johannes Müller

Materials Chemistry · with Mikolajick · 2011–2015

A researcher in the Science corpus: 12 papers; trusts 3 researchers and is trusted by 16 researchers here, as inferred from the citation graph.

Subfields

Whom Johannes Müller trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Min Hyuk Park
  2. Stefan Mueller

Who trusts Johannes Müller overall

  1. Min Hyuk Park
  2. Robin Materlik
  3. Nanbo Gong
  4. Sergej Starschich
  5. Thomas Mikolajick
  6. Uwe Schroeder
  7. Tony Schenk
  8. Han Joon Kim
  9. T. Ma
  10. Stefan Mueller

Papers from Johannes Müller's perspective

Ordered by how strongly the researchers Johannes Müller trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Ferroelectricity in hafnium oxide thin films
  2. Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories (2013 IEEE International Electron Devices Meeting)
  3. Novel ferroelectric FET based synapse for neuromorphic systems (Symposium on VLSI Technology)
  4. A review of recent MOSFET threshold voltage extraction methods (Microelectronics and reliability)
  5. A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs (International Electron Devices Meeting)
  6. Review on high-k dielectrics reliability issues (IEEE transactions on device and materials reliability)
  7. Vacancy and interstitial defects in hafnia
  8. Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films
  9. High dielectric constant gate oxides for metal oxide Si transistors
  10. Pipe-shaped BiCS flash memory with 16 stacked layers and multi-level-cell operation for ultra high density storage devices (Symposium on VLSI Technology)

Their papers