Han Joon Kim

Materials Chemistry · 2013–2015

A researcher in the Science corpus: 10 papers; trusts 6 researchers and is trusted by 5 researchers here, as inferred from the citation graph.

Subfields

Whom Han Joon Kim trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Min Hyuk Park
  2. Johannes Müller
  3. Stefan Mueller
  4. Y. Kim

Who trusts Han Joon Kim overall

  1. Min Hyuk Park
  2. Sergej Starschich
  3. Thomas Mikolajick
  4. Uwe Schroeder
  5. Alireza Kashir
  6. Tony Schenk
  7. Young Hwan Lee
  8. Z. Fan
  9. Robin Materlik

Papers from Han Joon Kim's perspective

Ordered by how strongly the researchers Han Joon Kim trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Novel ferroelectric FET based synapse for neuromorphic systems (Symposium on VLSI Technology)
  2. Ferroelectricity in hafnium oxide thin films
  3. Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories (2013 IEEE International Electron Devices Meeting)
  4. A review of recent MOSFET threshold voltage extraction methods (Microelectronics and reliability)
  5. Physical properties of crystals
  6. High dielectric constant gate oxides for metal oxide Si transistors
  7. Vacancy and interstitial defects in hafnia
  8. Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films
  9. Review on high-k dielectrics reliability issues (IEEE transactions on device and materials reliability)
  10. Pipe-shaped BiCS flash memory with 16 stacked layers and multi-level-cell operation for ultra high density storage devices (Symposium on VLSI Technology)

Their papers