Nanbo Gong
Electrical and Electronic Engineering · 2016–2018
A researcher in the Science corpus: 2 papers; trusts 6 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 13 citations into it
- Materials Chemistry — 9 citations into it
Whom Nanbo Gong trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Nanbo Gong's perspective
Ordered by how strongly the researchers Nanbo Gong trusts endorse each paper. Same corpus, a different order for every researcher.
- Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films
- Charge-Trapping Phenomena in HfO2-Based FeFET-Type Nonvolatile Memories (IEEE Transactions on Electron Devices)
- Phase transitions in ferroelectric silicon doped hafnium oxide
- Impact of different dopants on the switching properties of ferroelectric hafniumoxide
- Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects
- Charge trapping in ultrathin hafnium oxide (IEEE Electron Device Letters)
- Deep Residual Learning for Image Recognition (Computer Vision and Pattern Recognition)
- ImageNet classification with deep convolutional neural networks
- Gradient-based learning applied to document recognition
- Attention is All you Need (Neural Information Processing Systems)