Wake-up effects in Si-doped hafnium oxide ferroelectric thin films

By Dayu Zhou, Jin Xu, Qing Li, Y. Guan, F. Cao, Xianlin Dong, Johannes Müller, Tony Schenk, U. Schröder. 2013

347 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/851c4c450213d1ce443b7eb526b468bed10b66db