Ferroelectric properties and switching endurance of Hf0.5Zr0.5O2 films on TiN bottom and TiN or RuO2 top electrodes

By Min Hyuk Park, Han Joon Kim, Y. Kim, W. Jeon, Tae-Houng Moon, C. S. Hwang. 2014

138 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/5e058e669a75cef66a447dea3f430248d069d37b