Young Hwan Lee

Materials Chemistry · 2014–2018

A researcher in the Science corpus: 5 papers; trusts 4 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Young Hwan Lee trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Min Hyuk Park
  2. Han Joon Kim

Papers from Young Hwan Lee's perspective

Ordered by how strongly the researchers Young Hwan Lee trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Novel ferroelectric FET based synapse for neuromorphic systems (Symposium on VLSI Technology)
  2. Physical Mechanisms behind the Field‐Cycling Behavior of HfO2‐Based Ferroelectric Capacitors
  3. Ferroelectricity in hafnium oxide thin films
  4. High dielectric constant gate oxides for metal oxide Si transistors
  5. A review of recent MOSFET threshold voltage extraction methods (Microelectronics and reliability)
  6. Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories (2013 IEEE International Electron Devices Meeting)
  7. Vacancy and interstitial defects in hafnia
  8. Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films
  9. Ferroelectric solid solutions with morphotropic boundaries: Vanishing polarization anisotropy, adaptive, polar glass, and two-phase states
  10. Influence of short-range and long-range order on the evolution of the morphotropic phase boundary in Pb Zr[sub 1−x]Ti[sub x] O₃

Their papers