Jungwoo Joh

Condensed Matter Physics · 2006–2011

A researcher in the Science corpus: 7 papers; trusts 5 researchers and is trusted by 7 researchers here, as inferred from the citation graph.

Subfields

Whom Jungwoo Joh trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Gaudenzio Meneghesso
  2. J. D. del Alamo
  3. P. Klein
  4. A. Sarua
  5. Giovanni Verzellesi
  6. Martin Kuball
  7. Thomas E. Kazior

Who trusts Jungwoo Joh overall

  1. J. D. del Alamo
  2. Enrico Zanoni
  3. Matteo Meneghini
  4. Gaudenzio Meneghesso
  5. Alessandro Chini
  6. B. Baliga
  7. Denis Marcon

Papers from Jungwoo Joh's perspective

Ordered by how strongly the researchers Jungwoo Joh trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Trapping effects in GaN and SiC microwave FETs (Proceedings of the IEEE)
  2. 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
  3. Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors (International Electron Devices Meeting)
  4. The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
  5. Surface-related drain current dispersion effects in AlGaN-GaN HEMTs (IEEE Transactions on Electron Devices)
  6. Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy
  7. Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures (IEEE Transactions on Electron Devices)
  8. A study on current collapse in AlGaN/GaN HEMTs induced by bias stress
  9. Integrated Optical and Electrical Analysis: Identifying Location and Properties of Traps in AlGaN/GaN HEMTs During Electrical Stress (IEEE Electron Device Letters)
  10. Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices (IEEE Transactions on Electron Devices)

Their papers