P. Klein

Electrical and Electronic Engineering · with Binari · 2001–2008

A researcher in the Science corpus: 4 papers; trusts 2 researchers and is trusted by 2 researchers here, as inferred from the citation graph.

Subfields

Whom P. Klein trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Dieter K. Schroder

Who trusts P. Klein overall

  1. Jungwoo Joh
  2. Tsunenobu Kimoto
  3. Michael J. Uren

Papers from P. Klein's perspective

Ordered by how strongly the researchers P. Klein trusts endorse each paper. Same corpus, a different order for every researcher.

  1. The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs (IEEE Electron Device Letters)
  2. The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
  3. SIMS investigations into the effect of growth conditions on residual impurity and silicon incorporation in GaN and AlxGa1−xN
  4. Current collapse and the role of carbon in AlGaN/GaN high electron mobility transistors grown by metalorganic vapor-phase epitaxy
  5. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)
  6. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
  7. Dynamic recovery of negative bias temperature instability in p-type metal–oxide–semiconductor field-effect transistors
  8. Impact of NBTI on the temporal performance degradation of digital circuits (IEEE Electron Device Letters)
  9. The negative bias temperature instability in MOS devices: A review (Microelectronics and reliability)
  10. Gallium nitride based high power heterojunction field effect transistors: process development and present status at UCSB

Their papers