J. D. del Alamo

Electrical and Electronic Engineering · 2001–2014

A researcher in the Science corpus: 10 papers; trusts 7 researchers and is trusted by 16 researchers here, as inferred from the citation graph.

Subfields

Whom J. D. del Alamo trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jungwoo Joh
  2. Gaudenzio Meneghesso
  3. Peide D. Ye
  4. G. Wilk

Who trusts J. D. del Alamo overall

  1. Qiang Li
  2. Han Liu
  3. Kei May Lau
  4. Jungwoo Joh
  5. Enrico Zanoni
  6. Filippo Giubileo
  7. D. Fleetwood
  8. Matteo Meneghini
  9. Peide D. Ye
  10. Kelin J. Kuhn

Papers from J. D. del Alamo's perspective

Ordered by how strongly the researchers J. D. del Alamo trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Trapping effects in GaN and SiC microwave FETs (Proceedings of the IEEE)
  2. Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors (International Electron Devices Meeting)
  3. Surface-related drain current dispersion effects in AlGaN-GaN HEMTs (IEEE Transactions on Electron Devices)
  4. 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
  5. A study on current collapse in AlGaN/GaN HEMTs induced by bias stress
  6. Integrated Optical and Electrical Analysis: Identifying Location and Properties of Traps in AlGaN/GaN HEMTs During Electrical Stress (IEEE Electron Device Letters)
  7. Thermal resistance calculation of AlGaN-GaN devices (IEEE transactions on microwave theory and techniques)
  8. Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices (IEEE Transactions on Electron Devices)
  9. AlGaN/GaN HFET reliability (IEEE Microwave Magazine)
  10. TEM Observation of Crack- and Pit-Shaped Defects in Electrically Degraded GaN HEMTs (IEEE Electron Device Letters)

Their papers