Enrico Zanoni

Condensed Matter Physics · 2003–2018

A researcher in the Science corpus: 16 papers; trusts 7 researchers and is trusted by 3 researchers here, as inferred from the citation graph.

Subfields

Whom Enrico Zanoni trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jungwoo Joh
  2. J. D. del Alamo
  3. Gaudenzio Meneghesso

Who trusts Enrico Zanoni overall

  1. Matteo Meneghini

Papers from Enrico Zanoni's perspective

Ordered by how strongly the researchers Enrico Zanoni trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors (International Electron Devices Meeting)
  2. 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
  3. Trapping effects in GaN and SiC microwave FETs (Proceedings of the IEEE)
  4. The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
  5. Integrated Optical and Electrical Analysis: Identifying Location and Properties of Traps in AlGaN/GaN HEMTs During Electrical Stress (IEEE Electron Device Letters)
  6. Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices (IEEE Transactions on Electron Devices)
  7. A study on current collapse in AlGaN/GaN HEMTs induced by bias stress
  8. AlGaN/GaN HFET reliability (IEEE Microwave Magazine)
  9. TEM Observation of Crack- and Pit-Shaped Defects in Electrically Degraded GaN HEMTs (IEEE Electron Device Letters)
  10. The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs (IEEE Electron Device Letters)

Their papers