Giovanni Verzellesi
Condensed Matter Physics · 2004–2013
A researcher in the Science corpus: 5 papers; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Condensed Matter Physics — 59 citations into it; #1,742 of 1,948 by trust here, #742 by citations
- Electronic, Optical and Magnetic Materials — 20 citations into it
Whom Giovanni Verzellesi trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Giovanni Verzellesi overall
Papers from Giovanni Verzellesi's perspective
Ordered by how strongly the researchers Giovanni Verzellesi trusts endorse each paper. Same corpus, a different order for every researcher.
- The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
- The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs (IEEE Electron Device Letters)
- 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
- 10-W/mm AlGaN-GaN HFET with a field modulating plate (IEEE Electron Device Letters)
- Trapping effects in GaN and SiC microwave FETs (Proceedings of the IEEE)
- Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors (International Electron Devices Meeting)
- A study on current collapse in AlGaN/GaN HEMTs induced by bias stress
- Slow transients observed in AlGaN/GaN HFETs: effects of SiN/sub x/ passivation and UV illumination
- Mechanisms of current collapse and gate leakage currents in AlGaN/GaN heterostructure field effect transistors
- Polarization effects, surface states, and the source of electrons in AlGaN/GaN heterostructure field effect transistors
Their papers
- Surface-related drain current dispersion effects in AlGaN-GaN HEMTs (2004) — 332 citations
- Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives (2008) — 634 citations
- Current Collapse and High-Electric-Field Reliability of Unpassivated GaN/AlGaN/GaN HEMTs (2006) — 169 citations
- Efficiency droop in InGaN/GaN blue light-emitting diodes: Physical mechanisms and remedies (2013) — 392 citations
- Investigation of High-Electric-Field Degradation Effects in AlGaN/GaN HEMTs (2008) — 139 citations