Alessandro Chini

Condensed Matter Physics · 2004–2014

A researcher in the Science corpus: 6 papers; trusts 3 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Alessandro Chini trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jungwoo Joh

Papers from Alessandro Chini's perspective

Ordered by how strongly the researchers Alessandro Chini trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors (International Electron Devices Meeting)
  2. 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
  3. Integrated Optical and Electrical Analysis: Identifying Location and Properties of Traps in AlGaN/GaN HEMTs During Electrical Stress (IEEE Electron Device Letters)
  4. The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
  5. Surface-related drain current dispersion effects in AlGaN-GaN HEMTs (IEEE Transactions on Electron Devices)
  6. AlGaN/GaN HFET reliability (IEEE Microwave Magazine)
  7. TEM Observation of Crack- and Pit-Shaped Defects in Electrically Degraded GaN HEMTs (IEEE Electron Device Letters)
  8. The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs (IEEE Electron Device Letters)
  9. Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives (IEEE transactions on device and materials reliability)
  10. 40-W/mm Double Field-plated GaN HEMTs (Device Research Conference)

Their papers