Mamidala Jagadesh Kumar

Electrical and Electronic Engineering · 2004–2016

A researcher in the Science corpus: 10 papers; trusts 17 researchers and is trusted by 9 researchers here, as inferred from the citation graph.

Subfields

Whom Mamidala Jagadesh Kumar trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. K. Boucart
  2. Adrian M. Ionescu
  3. Anurag Chaudhry
  4. D. Abdi
  5. M. Jagadesh Kumar
  6. Alan C. Seabaugh
  7. V. Nagavarapu
  8. Y. Qiu
  9. S. Janardhanan
  10. Ritesh Jhaveri

Who trusts Mamidala Jagadesh Kumar overall

  1. Anurag Chaudhry
  2. Shubham Sahay
  3. Sneh Saurabh
  4. J. Madan
  5. D. Abdi
  6. Sanjay Kumar
  7. Ratul Kumar Baruah
  8. G. Reddy
  9. Rishu Chaujar

Papers from Mamidala Jagadesh Kumar's perspective

Ordered by how strongly the researchers Mamidala Jagadesh Kumar trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Double-Gate Tunnel FET With High-$\kappa$ Gate Dielectric (IEEE Transactions on Electron Devices)
  2. Low-subthreshold-swing tunnel transistors (IEEE Electron Device Letters)
  3. The Charge Plasma P-N Diode (IEEE Electron Device Letters)
  4. Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric
  5. The Tunnel Source (PNPN) n-MOSFET: A Novel High Performance Transistor (IEEE Transactions on Electron Devices)
  6. Double-Gate Strained-Ge Heterostructure Tunneling FET (TFET) With record high drive currents and ≪60mV/dec subthreshold slope (2008 IEEE International Electron Devices Meeting)
  7. Effect of Pocket Doping and Annealing Schemes on the Source-Pocket Tunnel Field-Effect Transistor (IEEE Transactions on Electron Devices)
  8. Steep Subthreshold Slope n- and p-Type Tunnel-FET Devices for Low-Power and Energy-Efficient Digital Circuits (IEEE Transactions on Electron Devices)
  9. Complementary Silicon-Based Heterostructure Tunnel-FETs With High Tunnel Rates (IEEE Electron Device Letters)
  10. Low-Voltage Tunnel Transistors for Beyond CMOS Logic (Proceedings of the IEEE)

Their papers