Anurag Chaudhry

IEEE transactions on device and materials reliability · 2004

A researcher in the Science corpus: 2 papers; trusts 1 researcher and is trusted by 2 researchers here, as inferred from the citation graph.

Whom Anurag Chaudhry trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Mamidala Jagadesh Kumar

Who trusts Anurag Chaudhry overall

  1. Sneh Saurabh
  2. Mamidala Jagadesh Kumar
  3. G. Reddy

Papers from Anurag Chaudhry's perspective

Ordered by how strongly the researchers Anurag Chaudhry trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Controlling short-channel effects in deep-submicron SOI MOSFETs for improved reliability: a review (IEEE transactions on device and materials reliability)
  2. Sub-60-nm quasi-planar FinFETs fabricated using a simplified process (IEEE Electron Device Letters)
  3. An analytical solution to a double-gate MOSFET with undoped body
  4. Effect of Pocket Doping and Annealing Schemes on the Source-Pocket Tunnel Field-Effect Transistor (IEEE Transactions on Electron Devices)
  5. The Charge Plasma P-N Diode (IEEE Electron Device Letters)
  6. Complementary Silicon-Based Heterostructure Tunnel-FETs With High Tunnel Rates (IEEE Electron Device Letters)
  7. Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure (IEEE Transactions on Electron Devices)
  8. Fabrication and mobility characteristics of ultra-thin strained Si directly on insulator (SSDOI) MOSFETs (IEEE International Electron Devices Meeting 2003)
  9. Performance Comparison Between p-i-n Tunneling Transistors and Conventional MOSFETs (IEEE Transactions on Electron Devices)
  10. Double-Gate Strained-Ge Heterostructure Tunneling FET (TFET) With record high drive currents and ≪60mV/dec subthreshold slope (2008 IEEE International Electron Devices Meeting)

Their papers