King-Ning Tu
Electrical and Electronic Engineering · 2000–2020
A researcher in the Science corpus: 32 papers; trusts 3 researchers and is trusted by 16 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 51 citations into it; #1,999 of 16,539 by trust here, #2,811 by citations
- Mechanical Engineering — 37 citations into it; #6,296 of 8,300 by trust here, #2,316 by citations
- Electronic, Optical and Magnetic Materials — 9 citations into it; #544 of 2,886 by trust here, #1,346 by citations
Whom King-Ning Tu trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts King-Ning Tu overall
- Chih Chen
- Satish G. Kandlikar
- Hiren R. Kotadia
- Yan Cheong Chan
- Hsiang-Yao Hsiao
- K. Zeng
- Chih Chen
- Muammer Kaya
- Liang Zhang
- Yuan-Wei Chang
Papers from King-Ning Tu's perspective
Ordered by how strongly the researchers King-Ning Tu trusts endorse each paper. Same corpus, a different order for every researcher.
- Effect of Sn grain orientation on electromigration degradation mechanism in high Sn-based Pb-free solders
- Effect of current crowding on void propagation at the interface between intermetallic compound and solder in flip chip solder joints
- Thermomigration in SnPb composite flip chip solder joints
- Solder Joint Technology
- Six cases of reliability study of Pb-free solder joints in electronic packaging technology
- Electromigration in Sn-Pb solder strips as a function of alloy composition
- Effects of Co and Ni addition on reactive diffusion between Sn–3.5Ag solder and Cu during soldering and annealing
- Experimental and thermodynamic assessment of Sn-Ag-Cu solder alloys
- A study on the reaction between Cu and Sn3.5Ag solder doped with small amounts of Ni
- Improvement on the microstructure stability, mechanical and wetting properties of Sn-Ag-Cu lead-free solder with the addition of rare earth elements
Their papers
- Solder Joint Technology (2007) — 143 citations
- Effect of current crowding on void propagation at the interface between intermetallic compound and solder in flip chip solder joints (2006) — 158 citations
- Thermomigration in SnPb composite flip chip solder joints (2006) — 153 citations
- Six cases of reliability study of Pb-free solder joints in electronic packaging technology (2002) — 1,350 citations
- Electromigration in Sn-Pb solder strips as a function of alloy composition (2000) — 149 citations
- Electromigration and Thermomigration in Pb-Free Flip-Chip Solder Joints (2010) — 285 citations
- Tin–lead (SnPb) solder reaction in flip chip technology (2001) — 578 citations
- Reliability challenges in 3D IC packaging technology (2011) — 633 citations
- Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction (2003) — 175 citations
- Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn–3.5Ag, Sn–3.8Ag–0.7Cu and Sn–0.7Cu) on Cu (2002) — 248 citations
- Low melting point solders based on Sn, Bi, and In elements (2020) — 230 citations
- Recent advances on kinetic analysis of solder joint reactions in 3D IC packaging technology (2019) — 156 citations
- Structure and properties of lead-free solders bearing micro and nano particles (2014) — 297 citations
- Thermomigration in solder joints (2012) — 154 citations
- Solder Joint Technology: Materials, Properties, and Reliability (2007) — 199 citations
- Hollow nanostructures based on the Kirkendall effect: Design and stability considerations (2005) — 221 citations
- Polarity effect of electromigration on kinetics of intermetallic compound formation in Pb-free solder V-groove samples (2005) — 264 citations
- Spontaneous whisker growth on lead-free solder finishes (2005) — 181 citations
- Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability (2005) — 439 citations
- In situ observation of the void formation-and-propagation mechanism in solder joints under current-stressing (2005) — 151 citations