Hsiang-Yao Hsiao
Electrical and Electronic Engineering · 2012
A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 10 citations into it
Whom Hsiang-Yao Hsiao trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Hsiang-Yao Hsiao's perspective
Ordered by how strongly the researchers Hsiang-Yao Hsiao trusts endorse each paper. Same corpus, a different order for every researcher.
- Solder Joint Technology
- Effect of Sn grain orientation on electromigration degradation mechanism in high Sn-based Pb-free solders
- Effect of current crowding on void propagation at the interface between intermetallic compound and solder in flip chip solder joints
- Thermomigration in SnPb composite flip chip solder joints
- Electromigration in Sn-Pb solder strips as a function of alloy composition
- Six cases of reliability study of Pb-free solder joints in electronic packaging technology
- An analysis of rechargeable lithium-ion batteries after prolonged cycling
- Graphene microsheets enter cells through spontaneous membrane penetration at edge asperities and corner sites (Proceedings of the National Academy of Sciences of the United States of America)
- Gas-phase production of carbon single-walled nanotubes from carbon monoxide via the HiPco process: A parametric study
- Preparation, Structure, and Electrochemical Properties of Reduced Graphene Sheet Films
Their papers
- Thermomigration in solder joints (2012) — 154 citations