Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction

By W. Choi, T. Lee, King-Ning Tu, N. Tamura, R. Celestre, A. MacDowell, Y. Bong, L. Nguyen. 2003

175 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, General Materials Science

View Paper: https://www.semanticscholar.org/paper/00285f74e82e0babc62e3caeaeb576d9de880208

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In Electrical and Electronic Engineering

  1. G. Galyon

In General Materials Science

  1. G. Galyon

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