ELDRS in bipolar linear circuits: A review

By R. Pease, peixiong zhao, D. Fleetwood. European Conference on Radiation and Its Effects on Components and Systems, 2008

173 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/ee7113247a5688df69ecf862d68051f4820d310a

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In Electrical and Electronic Engineering

1. D. Fleetwood

Citations in the corpus

• Evolution of Total Ionizing Dose Effects in MOS Devices With Moore’s Law Scaling (2018, background): “Linear bipolar technologies [8], [18] and power electronics and other MOS devices with thicker SiO2 gate dielectrics [4], [19], [20] remain of significant practical interest, and tend to be much less radiation tolerant and much less affected by Moore’s law”