J. Schwank

Electrical and Electronic Engineering · 2000–2010

A researcher in the Science corpus: 9 papers; trusts 3 researchers and is trusted by 7 researchers here, as inferred from the citation graph.

Subfields

Whom J. Schwank trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Paul E. Dodd

Who trusts J. Schwank overall

  1. D. Fleetwood
  2. Paul E. Dodd
  3. Véronique Ferlet-Cavrois

Papers from J. Schwank's perspective

Ordered by how strongly the researchers J. Schwank trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
  2. Production and propagation of single-event transients in high-speed digital logic ICs (IEEE Transactions on Nuclear Science)
  3. SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments
  4. On-Chip Characterization of Single-Event Transient Pulsewidths (IEEE transactions on device and materials reliability)
  5. Heavy ion-induced digital single-event transients in deep submicron Processes (IEEE Transactions on Nuclear Science)
  6. The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM (IEEE Transactions on Nuclear Science)
  7. Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM (IEEE Transactions on Nuclear Science)
  8. Cramming More Components Onto Integrated Circuits
  9. Worst-case bias during total dose irradiation of SOI transistors
  10. Application of hardness-by-design methodology to radiation-tolerant ASIC technologies

Their papers