$1/f$ Noise and Defects in Microelectronic Materials and Devices

By D. Fleetwood. IEEE Transactions on Nuclear Science, 2015

153 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/6eea1da9b8425a4d4d1c70ec5567736748e712a7

Citations in the corpus

• Evolution of Total Ionizing Dose Effects in MOS Devices With Moore’s Law Scaling (2018, unknown): “noise [143]–[148].”
• Low-frequency charge noise in Si/SiGe quantum dots (2019, unknown): “[41] D.”