Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices

By D. Fleetwood. IEEE Transactions on Nuclear Science, 2013

332 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/fadf19d382e4959b173bc43cb78057e5fd42f7d1