R. Lacoe
Electrical and Electronic Engineering · 2008
A researcher in the Science corpus: 1 paper; trusts 4 researchers and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 12 citations into it; #12,590 of 16,539 by trust here, #15,217 by citations
Whom R. Lacoe trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts R. Lacoe overall
Papers from R. Lacoe's perspective
Ordered by how strongly the researchers R. Lacoe trusts endorse each paper. Same corpus, a different order for every researcher.
- Heavy ion-induced digital single-event transients in deep submicron Processes (IEEE Transactions on Nuclear Science)
- Computational method to estimate Single Event Upset rates in an accelerator environment
- Charge Collection and Charge Sharing in a 130 nm CMOS Technology (IEEE Transactions on Nuclear Science)
- RHBD techniques for mitigating effects of single-event hits using guard-gates (IEEE Transactions on Nuclear Science)
- The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM (IEEE Transactions on Nuclear Science)
- Radiation-induced edge effects in deep submicron CMOS transistors (IEEE Transactions on Nuclear Science)
- Application of hardness-by-design methodology to radiation-tolerant ASIC technologies
- Hafnium and zirconium silicates for advanced gate dielectrics
- Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
- Digital Single Event Transient Trends With Technology Node Scaling (IEEE Transactions on Nuclear Science)