Eduard A. Cartier

Electrical and Electronic Engineering · 2000–2009

A researcher in the Science corpus: 11 papers; trusts 7 researchers and is trusted by 2 researchers here, as inferred from the citation graph.

Subfields

Whom Eduard A. Cartier trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. John Robertson
  2. G. Wilk
  3. Evgeni P. Gusev
  4. Andreas Kerber
  5. Sufi Zafar

Who trusts Eduard A. Cartier overall

  1. John Robertson
  2. Evgeni P. Gusev
  3. Andreas Kerber
  4. Sufi Zafar

Papers from Eduard A. Cartier's perspective

Ordered by how strongly the researchers Eduard A. Cartier trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics (IEEE Electron Device Letters)
  2. New physics-based analytic approach to the thin-oxide breakdown statistics (IEEE Electron Device Letters)
  3. Ultrathin high-K gate stacks for advanced CMOS devices (International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224))
  4. Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues
  5. Defect dominated charge transport in amorphous Ta2O5 thin films
  6. Charge trapping in ultrathin hafnium oxide (IEEE Electron Device Letters)
  7. Observation of bulk HfO2 defects by spectroscopic ellipsometry
  8. Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks
  9. Review on high-k dielectrics reliability issues (IEEE transactions on device and materials reliability)
  10. Carrier transport in HfO/sub 2//metal gate MOSFETs: physical insight into critical parameters (IEEE Transactions on Electron Devices)

Their papers