Sufi Zafar

Electrical and Electronic Engineering · 2001–2006

A researcher in the Science corpus: 5 papers; trusts 3 researchers and is trusted by 5 researchers here, as inferred from the citation graph.

Subfields

Whom Sufi Zafar trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Evgeni P. Gusev
  2. M. A. Alam
  3. G. Wilk
  4. John Robertson
  5. Ben Kaczer
  6. T. Ma
  7. Eduard A. Cartier
  8. Souvik Mahapatra

Who trusts Sufi Zafar overall

  1. Dieter K. Schroder
  2. John Robertson
  3. Evgeni P. Gusev
  4. Arvind Kumar
  5. John F. Conley
  6. Eduard A. Cartier

Papers from Sufi Zafar's perspective

Ordered by how strongly the researchers Sufi Zafar trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues
  2. AND T
  3. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)
  4. Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics (IEEE Electron Device Letters)
  5. Ultrathin high-K gate stacks for advanced CMOS devices (International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224))
  6. Alternative dielectrics to silicon dioxide for memory and logic devices (Nature)
  7. Charge trapping in ultrathin hafnium oxide (IEEE Electron Device Letters)
  8. Observation of bulk HfO2 defects by spectroscopic ellipsometry
  9. Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks
  10. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)

Their papers