Accelerated Life Test of High Brightness Light Emitting Diodes
By Lorenzo Trevisanello, Matteo Meneghini, G. Mura, M. Vanzi, M. Pavesi, Gaudenzio Meneghesso, Enrico Zanoni. IEEE transactions on device and materials reliability, 2008
161 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/6fa5493fd69abb0e9f0c6f09986006f849af2673
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In Condensed Matter Physics
In Electrical and Electronic Engineering
Citations in the corpus
- Light emitting diodes reliability review (2012, unknown): “preting the results of accelerated testing [20–22].”
- A General Photo-Electro-Thermal Theory for Light Emitting Diode (LED) Systems (2009, background): “Accelerated age tests carried out in [9] show that the light output can drop by further 45%.”