Massimo V. Fischetti

IBM Journal of Research and Development · 2001–2007

A researcher in the Science corpus: 10 papers; trusts 0 researchers and is trusted by 22 researchers here, as inferred from the citation graph.

Whom Massimo V. Fischetti trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. David Esseni

Who trusts Massimo V. Fischetti overall

  1. Seonghoon Jin
  2. E. Wang
  3. S. Thompson
  4. Ting-Wei Tang
  5. John Robertson
  6. David Esseni
  7. Kelin J. Kuhn
  8. H. Philip Wong
  9. Douglas J. Paul
  10. Philippe Matagne

Papers from Massimo V. Fischetti's perspective

Ordered by how strongly the researchers Massimo V. Fischetti trusts endorse each paper. Same corpus, a different order for every researcher.

  1. On experimental determination of carrier velocity in deeply scaled NMOS: how close to the thermal limit? (IEEE Electron Device Letters)
  2. Fabrication and mobility characteristics of ultra-thin strained Si directly on insulator (SSDOI) MOSFETs (IEEE International Electron Devices Meeting 2003)
  3. Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm (Digest. International Electron Devices Meeting,)
  4. Device scaling limits of Si MOSFETs and their application dependencies (Proceedings of the IEEE)
  5. The effective drive current in CMOS inverters (Digest. International Electron Devices Meeting,)
  6. Six-band k⋅p calculation of the hole mobility in silicon inversion layers: Dependence on surface orientation, strain, and silicon thickness
  7. Limits to binary logic switch scaling - a gedanken model (Proceedings of the IEEE)
  8. Tri-Gate fully-depleted CMOS transistors: fabrication, design and layout (2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407))
  9. Self-Consistent Equations Including Exchange and Correlation Effects
  10. Inhomogeneous Electron Gas

Their papers