Seonghoon Jin

Electrical and Electronic Engineering · 2006–2007

A researcher in the Science corpus: 3 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Seonghoon Jin trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Massimo V. Fischetti
  2. David Esseni
  3. Supriyo Datta

Who trusts Seonghoon Jin overall

  1. Kelin J. Kuhn

Papers from Seonghoon Jin's perspective

Ordered by how strongly the researchers Seonghoon Jin trusts endorse each paper. Same corpus, a different order for every researcher.

  1. On experimental determination of carrier velocity in deeply scaled NMOS: how close to the thermal limit? (IEEE Electron Device Letters)
  2. Self-Consistent Equations Including Exchange and Correlation Effects
  3. Inhomogeneous Electron Gas
  4. Effective electron mobility in Si inversion layers in metal–oxide–semiconductor systems with a high-κ insulator: The role of remote phonon scattering
  5. Carrier scattering induced by thickness fluctuation of silicon-on-insulator film in ultrathin-body metal–oxide–semiconductor field-effect transistors
  6. Fabrication and mobility characteristics of ultra-thin strained Si directly on insulator (SSDOI) MOSFETs (IEEE International Electron Devices Meeting 2003)
  7. Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm (Digest. International Electron Devices Meeting,)
  8. Device scaling limits of Si MOSFETs and their application dependencies (Proceedings of the IEEE)
  9. On the performance limits for Si MOSFETs: a theoretical study
  10. Six-band k⋅p calculation of the hole mobility in silicon inversion layers: Dependence on surface orientation, strain, and silicon thickness

Their papers