Yuan Taur

Electrical and Electronic Engineering · 2000–2012

A researcher in the Science corpus: 10 papers; trusts 3 researchers and is trusted by 16 researchers here, as inferred from the citation graph.

Subfields

Whom Yuan Taur trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Xiaoping Liang
  2. Jerry G. Fossum

Who trusts Yuan Taur overall

  1. Jae-Joon Kim
  2. Qiang Chen
  3. Kaushik Roy
  4. Juan Pablo Duarte
  5. Bo Yu
  6. Qian Xie
  7. Shiying Xiong
  8. Huaxin Lu
  9. Evans M. Harrell II
  10. James D. Meindl

Papers from Yuan Taur's perspective

Ordered by how strongly the researchers Yuan Taur trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs (IEEE Electron Device Letters)
  2. Scaling challenges and device design requirements for high performance sub-50 nm gate length planar CMOS transistors (2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104))
  3. On the performance limits for Si MOSFETs: a theoretical study
  4. Device scaling limits of Si MOSFETs and their application dependencies (Proceedings of the IEEE)
  5. Continuous analytic I-V model for surrounding-gate MOSFETs (IEEE Electron Device Letters)
  6. Multiple-gate SOI MOSFETs
  7. Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
  8. An analytical solution to a double-gate MOSFET with undoped body
  9. Explicit continuous model for long-channel undoped surrounding gate MOSFETs (IEEE Transactions on Electron Devices)
  10. Double-gate CMOS: symmetrical- versus asymmetrical-gate devices

Their papers