Patrick Polakowski

Electrical and Electronic Engineering · 2012–2018

A researcher in the Science corpus: 10 papers; trusts 2 researchers and is trusted by 5 researchers here, as inferred from the citation graph.

Subfields

Whom Patrick Polakowski trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Johannes Müller
  2. Min Hyuk Park

Who trusts Patrick Polakowski overall

  1. Nanbo Gong
  2. Min Hyuk Park
  3. Rohit Batra
  4. Thomas Mikolajick

Papers from Patrick Polakowski's perspective

Ordered by how strongly the researchers Patrick Polakowski trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A review of recent MOSFET threshold voltage extraction methods (Microelectronics and reliability)
  2. Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories (2013 IEEE International Electron Devices Meeting)
  3. Charge-Trapping Phenomena in HfO2-Based FeFET-Type Nonvolatile Memories (IEEE Transactions on Electron Devices)
  4. A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs (International Electron Devices Meeting)
  5. Nanosecond Polarization Switching and Long Retention in a Novel MFIS-FET Based on Ferroelectric $\hbox{HfO}_{2}$ (IEEE Electron Device Letters)
  6. Why Is FE–HfO2 More Suitable Than PZT or SBT for Scaled Nonvolatile 1-T Memory Cell? A Retention Perspective (IEEE Electron Device Letters)
  7. VARIOT: a novel multilayer tunnel barrier concept for low-voltage nonvolatile memory devices (IEEE Electron Device Letters)
  8. A Study of Endurance Issues in HfO2-Based Ferroelectric Field Effect Transistors: Charge Trapping and Trap Generation (IEEE Electron Device Letters)
  9. Ferroelectricity in hafnium oxide thin films
  10. Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films

Their papers