Arvind Kumar

Electrical and Electronic Engineering · with Bernstein · 2005–2006

A researcher in the Science corpus: 3 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Arvind Kumar trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Sufi Zafar
  2. Evgeni P. Gusev

Papers from Arvind Kumar's perspective

Ordered by how strongly the researchers Arvind Kumar trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues
  2. Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics (IEEE Electron Device Letters)
  3. Ultrathin high-K gate stacks for advanced CMOS devices (International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224))
  4. Charge trapping in ultrathin hafnium oxide (IEEE Electron Device Letters)
  5. Observation of bulk HfO2 defects by spectroscopic ellipsometry
  6. Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks
  7. Six-band k⋅p calculation of the hole mobility in silicon inversion layers: Dependence on surface orientation, strain, and silicon thickness
  8. Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm (Digest. International Electron Devices Meeting,)
  9. Fabrication and mobility characteristics of ultra-thin strained Si directly on insulator (SSDOI) MOSFETs (IEEE International Electron Devices Meeting 2003)
  10. The effective drive current in CMOS inverters (Digest. International Electron Devices Meeting,)

Their papers