Kim S. Siow
Electrical and Electronic Engineering · 2006–2021
A researcher in the Science corpus: 6 papers; trusts 10 researchers and is trusted by 6 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 47 citations into it; #4,328 of 16,539 by trust here, #10,438 by citations
- Materials Chemistry — 16 citations into it
- Mechanical Engineering — 15 citations into it; #3,413 of 8,300 by trust here, #7,024 by citations
Whom Kim S. Siow trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
- J. Bai
- Guo-Quan Lu
- Katsuaki Suganuma
- C. Koch
- Vemal Raja Manikam
- Nikhilesh Chawla
- Xu Chen
- K. Lu
- Kuan Yew Cheong
Who trusts Kim S. Siow overall
Papers from Kim S. Siow's perspective
Ordered by how strongly the researchers Kim S. Siow trusts endorse each paper. Same corpus, a different order for every researcher.
- Thermomechanical Reliability of Low-Temperature Sintered Silver Die Attached SiC Power Device Assembly (IEEE transactions on device and materials reliability)
- Low-Temperature Sintered Nanoscale Silver as a Novel Semiconductor Device-Metallized Substrate Interconnect Material (IEEE transactions on components and packaging technologies)
- High-temperature electronics - a role for wide bandgap semiconductors? (Proceedings of the IEEE)
- High-Temperature Operation of SiC Power Devices by Low-Temperature Sintered Silver Die-Attachment (IEEE Transactions on Advanced Packaging)
- Silicon-carbide (SiC) semiconductor power electronics for extreme high-temperature environments (IEEE Aerospace Conference. Proceedings)
- Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys
- Low-Temperature Sintering with Nano-Silver Paste in Die-Attached Interconnection
- Void induced thermal impedance in power semiconductor modules: some transient temperature effects (Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248))
- Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow
- Survey on High-Temperature Packaging Materials for SiC-Based Power Electronics Modules (2007 IEEE Power Electronics Specialists Conference)
Their papers
- Plasma Methods for the Generation of Chemically Reactive Surfaces for Biomolecule Immobilization and Cell Colonization ‐ A Review (2006) — 917 citations
- Are Sintered Silver Joints Ready for Use as Interconnect Material in Microelectronic Packaging? (2014) — 290 citations
- Comparing the mechanical and thermal-electrical properties of sintered copper (Cu) and sintered silver (Ag) joints (2021) — 211 citations
- Microstructural studies and bonding strength of pressureless sintered nano-silver joints on silver, direct bond copper (DBC) and copper substrates aged at 300 °C (2016) — 185 citations
- Identifying the Development State of Sintered Silver (Ag) as a Bonding Material in the Microelectronic Packaging Via a Patent Landscape Study (2016) — 141 citations
- Mechanical properties of nano-silver joints as die attach materials (2012) — 362 citations