Silicon-carbide (SiC) semiconductor power electronics for extreme high-temperature environments
By J. Hornberger, A. Lostetter, K. Olejniczak, T. McNutt, S. M. Lal, A. Mantooth. IEEE Aerospace Conference. Proceedings, 2004
148 citations recorded by the source corpus.
Subfields: Aerospace Engineering, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/a97bf99c9d44b8a3bd47e89b3f5fc290836683a5
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In Electrical and Electronic Engineering
- Kuan Yew Cheong
- Vemal Raja Manikam
- Guo-Quan Lu
- D. Henry
- Laurent Mendizabal
- Alejandro G. Yepes
- J. Doval‐Gandoy
- Kim S. Siow
Citations in the corpus
- Die Attach Materials for High Temperature Applications: A Review (2011, background): “This technology has the potential to improve upon many of the current limitations associated with Si electronics, in particular, the limitations of silicon device switching speeds, junction temperatures, and power density [1].”
- Wide Bandgap Devices in AC Electric Drives: Opportunities and Challenges (2019, background): “landers for space exploration are typical examples of drives in high-temperature environment [18]-[20].”
- High-Temperature Operation of SiC Power Devices by Low-Temperature Sintered Silver Die-Attachment (2007, background): “This last feature of SiC devices opens the door to a wide range of application in the emerging area of high-temperature electronics [6].”
- Survey of High-Temperature Reliability of Power Electronics Packaging Components (2015, background): “temperatures, possess a higher breakdown voltage, present lower switching losses, and withstand higher current densities [1], [2].”