J. McPherson

Electrical and Electronic Engineering · with Shanware · 2000–2010

A researcher in the Science corpus: 4 papers; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

• Electrical and Electronic Engineering — 6 citations into it

Whom J. McPherson trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

1. Jordi Suñé
2. Michel Houssa

Who trusts J. McPherson overall

1. Andrea Padovani
2. P. Thomas
3. Huai Wang
4. Ximeng Guan
5. Souvik Mahapatra
6. M. A. Alam
7. Luca Larcher
8. S. Satapathy
9. Luca Vandelli

Papers from J. McPherson's perspective

Ordered by how strongly the researchers J. McPherson trusts endorse each paper. Same corpus, a different order for every researcher.

1. New physics-based analytic approach to the thin-oxide breakdown statistics (IEEE Electron Device Letters)
2. Complementary model for intrinsic time-dependent dielectric breakdown in SiO2 dielectrics
3. Multiple-gate SOI MOSFETs
4. A continuous, analytic drain-current model for DG MOSFETs
5. Beyond the conventional transistor (IBM Journal of Research and Development)
6. Modeling of nanoscale gate-all-around MOSFETs (IEEE Electron Device Letters)
7. Multiple-gate SOI MOSFETs: device design guidelines
8. Ultra-thin oxide reliability for ULSI applications
9. The Elements of Statistical Learning
10. Some Comments on Cp

Their papers

• Reliability Physics and Engineering: Time-To-Failure Modeling (2010) — 326 citations
• Thermochemical description of dielectric breakdown in high dielectric constant materials (2003) — 390 citations
• Complementary model for intrinsic time-dependent dielectric breakdown in SiO2 dielectrics (2000) — 173 citations
• Trends in the ultimate breakdown strength of high dielectric-constant materials (2003) — 327 citations