Trends in the ultimate breakdown strength of high dielectric-constant materials

By J. McPherson, Jinyoung Kim, A. Shanware, H. Mogul, John A. Rodriguez. 2003

327 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/dc216b0e0d6e66703f011edab052646534fc340f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. G. Ribes
2. J. Mitard
3. S. Bruyère
4. F. Monsieur
5. M. Denais
6. C. Parthasarathy
7. Emmanuel Vincent
8. Gerard Ghibaudo

Citations in the corpus

• Review on high-k dielectrics reliability issues (2005, methodology): “The thermo-chemical model has also been applied to explain high- breakdown phenomena ([59]), but this model results in more conservative and pessimistic reliability projection.”