Reliability Physics and Engineering: Time-To-Failure Modeling

By J. McPherson. 2010

326 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/93de5db7306ad88c094687c285c7354293b9a12d

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Frede Blaabjerg
2. Huai Wang
3. Marco Liserre
4. Xiongfei Wang
5. Friedrich Wilhelm Fuchs
6. Ke Ma
7. Yun Wei Li
8. Poh Chiang Loh

Citations in the corpus

• Failure and Reliability Analysis of a SiC Power Module Based on Stress Comparison to a Si Device (2017, background): “When the heat source is considered for the thermal analysis, the differential equation for the temperature calculation of the element in each layer is given by [32]”
• Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics (2014, background): “A typical stress-strain (σ-ε) curve for a material [55].”