Robert C. Baumann

Electrical and Electronic Engineering · 2001–2009

A researcher in the Science corpus: 4 papers; trusts 2 researchers and is trusted by 6 researchers here, as inferred from the citation graph.

Subfields

Whom Robert C. Baumann trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Paul E. Dodd
  2. Lloyd W. Massengill
  3. M. Kistler

Who trusts Robert C. Baumann overall

  1. Michael Nicolaidis
  2. Régis Leveugle
  3. A. Calvez
  4. Bianca Schroeder
  5. Paolo Maistri
  6. Paul E. Dodd
  7. Jean-Pierre Colinge
  8. Pierre Vanhauwaert

Papers from Robert C. Baumann's perspective

Ordered by how strongly the researchers Robert C. Baumann trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Heavy ion-induced digital single-event transients in deep submicron Processes (IEEE Transactions on Nuclear Science)
  2. Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM (IEEE Transactions on Nuclear Science)
  3. The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM (IEEE Transactions on Nuclear Science)
  4. Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells (IEEE Transactions on Nuclear Science)
  5. Soft error rate mitigation techniques for modern microcircuits (2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320))
  6. Modeling the effect of technology trends on the soft error rate of combinational logic (Proceedings : International Conference on Dependable Systems and Networks)
  7. Destructive single-event effects in semiconductor devices and ICs
  8. Impact of CMOS technology scaling on the atmospheric neutron soft error rate
  9. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
  10. A digital CMOS design technique for SEU hardening

Their papers