Pierre Vanhauwaert

2009 Design, Automation & Test in Europe Conference & Exhibition · 2009

A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Whom Pierre Vanhauwaert trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Robert C. Baumann

Papers from Pierre Vanhauwaert's perspective

Ordered by how strongly the researchers Pierre Vanhauwaert trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A Differential Fault Attack Technique against SPN Structures, with Application to the AES and KHAZAD (Workshop on Cryptographic Hardware and Embedded Systems)
  2. The Sorcerer's Apprentice Guide to Fault Attacks (Proceedings of the IEEE)
  3. Radiation-induced soft errors in advanced semiconductor technologies (IEEE transactions on device and materials reliability)
  4. Heavy ion-induced digital single-event transients in deep submicron Processes (IEEE Transactions on Nuclear Science)
  5. Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM (IEEE Transactions on Nuclear Science)
  6. Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells (IEEE Transactions on Nuclear Science)
  7. Destructive single-event effects in semiconductor devices and ICs
  8. The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM (IEEE Transactions on Nuclear Science)
  9. Soft error rate mitigation techniques for modern microcircuits (2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320))
  10. Modeling the effect of technology trends on the soft error rate of combinational logic (Proceedings : International Conference on Dependable Systems and Networks)

Their papers