Soft errors in advanced semiconductor devices-part I: the three radiation sources

By Robert C. Baumann. 2001

438 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture, Safety, Risk, Reliability and Quality

View Paper: https://www.semanticscholar.org/paper/cbbf07302b697f1b776e2f32ac68262bc5ff6c70