Soft errors in advanced computer systems

By Robert C. Baumann. IEEE Design & Test of Computers, 2005

926 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture, Safety, Risk, Reliability and Quality

View Paper: https://www.semanticscholar.org/paper/47526af5c2f81da8d5789e14d0cafc5eeea97c7e

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Michael Nicolaidis
2. Bianca Schroeder
3. Martin Ekerå
4. Craig Gidney

In Hardware and Architecture

1. Eduardo Pinheiro
2. Michael Nicolaidis
3. Wolf-Dietrich Weber

In Safety, Risk, Reliability and Quality

1. Michael Nicolaidis

Citations in the corpus

• Design for soft error mitigation (2005, methodology): “A significant problem is related to soft errors induced on one hand by alpha particles produced by radioactive isotope traces found in packaging, bonding, and die materials and on the other hand by atmospheric neutrons created by the interaction of cosmic rays with the earth atmosphere [1].”
• DRAM errors in the wild: a large-scale field study (2009, background): “Errors in dynamic random access memory (DRAM) devices have been a concern for a long time [3,11,15–17 , 23 ].”