Radiation-induced soft errors in advanced semiconductor technologies

By Robert C. Baumann. IEEE transactions on device and materials reliability, 2005

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Silent Data Corruptions at Scale (2021, background): “Previous work within the silent error domain studies the impact of soft errors due to radiation [11], and how environmental factors can lead to soft errors within the system.”
Current and Future Challenges in Radiation Effects on CMOS Electronics (2010, background): “Similarly, even though the DRAM bit SER is decreasing, the DRAM chip-level SER has remained roughly constant over many generations [10].”
Statistical fault injection: Quantified error and confidence (2009, methodology): “…P. Maistri, P. Vanhauwaert TIMA Laboratory (Grenoble INP, UJF, CNRS) 46 Avenue Félix Viallet - 38031 Grenoble Cedex - France Regis.Leveugle@imag.fr Abstract Fault injection has become a very classical method to determine the dependability of an integrated system with respect to soft errors.”
Memory Errors in Modern Systems: The Good, The Bad, and The Ugly (2015, background): “1 Effect of Altitude It is well-known that altitude will have an effect on modern SRAM devices due to high-energy neutrons from cosmic radiation [7], and particle strikes in DRAM were a problem in the past [23].”