Sanjay V. Kumar

Electrical and Electronic Engineering · 2006

A researcher in the Science corpus: 1 paper; trusts 3 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Sanjay V. Kumar trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Souvik Mahapatra
  2. Bipul Chandra Paul
  3. Yu Cao
  4. M. A. Alam
  5. P. B. Kumar
  6. Kun-hyuk Kang
  7. Dieter K. Schroder

Who trusts Sanjay V. Kumar overall

  1. Stewart E. Rauch

Papers from Sanjay V. Kumar's perspective

Ordered by how strongly the researchers Sanjay V. Kumar trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
  2. Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling (IEEE Electron Device Letters)
  3. Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs (IEEE Transactions on Electron Devices)
  4. A critical examination of the mechanics of dynamic NBTI for PMOSFETs (IEEE International Electron Devices Meeting 2003)
  5. NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs] (IEEE International Electron Devices Meeting 2003)
  6. Impact of NBTI on the temporal performance degradation of digital circuits (IEEE Electron Device Letters)
  7. Universal recovery behavior of negative bias temperature instability [PMOSFETs] (IEEE International Electron Devices Meeting 2003)
  8. New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation (Proceedings of the IEEE Custom Integrated Circuits Conference)
  9. Γ and B
  10. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)

Their papers