Impact of NBTI on SRAM read stability and design for reliability
By Sanjay V. Kumar, Chris Hyung-Il Kim, Sachin S. Sapatnekar. IEEE International Symposium on Quality Electronic Design, 2006
351 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/fbdb27b98a2ed3db6528644fc5c6acc1b5b353f0
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In Electrical and Electronic Engineering
Citations in the corpus
- Review and Reexamination of Reliability Effects Related to NBTI-Induced Statistical Variations (2007, background): “Both yield [18]–[21] and reliability [17], [22], [23] concerns”