Stewart E. Rauch

IEEE transactions on device and materials reliability · 2007

A researcher in the Science corpus: 1 paper; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Whom Stewart E. Rauch trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. M. A. Alam
  2. Sanjay V. Kumar
  3. Hans Reisinger

Who trusts Stewart E. Rauch overall

  1. Ben Kaczer

Papers from Stewart E. Rauch's perspective

Ordered by how strongly the researchers Stewart E. Rauch trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
  2. Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements (2006 IEEE International Reliability Physics Symposium Proceedings)
  3. The impact of intrinsic device fluctuations on CMOS SRAM cell stability (IEEE J. Solid State Circuits)
  4. Impact of NBTI on SRAM read stability and design for reliability (IEEE International Symposium on Quality Electronic Design)
  5. Universal recovery behavior of negative bias temperature instability [PMOSFETs] (IEEE International Electron Devices Meeting 2003)
  6. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
  7. Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs (IEEE Transactions on Electron Devices)
  8. NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs] (IEEE International Electron Devices Meeting 2003)
  9. Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling (IEEE Electron Device Letters)
  10. A comprehensive framework for predictive modeling of negative bias temperature instability (2004 IEEE International Reliability Physics Symposium. Proceedings)

Their papers