Bipul Chandra Paul

IEEE Transactions on Electron Devices · 2001–2010

A researcher in the Science corpus: 5 papers; trusts 0 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Whom Bipul Chandra Paul trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jayanth Srinivasan
  2. Dieter K. Schroder

Who trusts Bipul Chandra Paul overall

  1. Sanjay V. Kumar
  2. Souvik Mahapatra
  3. Dieter K. Schroder
  4. Chris Hyung-Il Kim

Papers from Bipul Chandra Paul's perspective

Ordered by how strongly the researchers Bipul Chandra Paul trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
  2. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
  3. Dynamic NBTI of PMOS transistors and its impact on device lifetime (2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.)
  4. Designing reliable systems from unreliable components: the challenges of transistor variability and degradation (IEEE Micro)
  5. Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling (IEEE Electron Device Letters)
  6. Electric Field Effect in Atomically Thin Carbon Films (Science)
  7. Razor: a low-power pipeline based on circuit-level timing speculation
  8. A critical examination of the mechanics of dynamic NBTI for PMOSFETs (IEEE International Electron Devices Meeting 2003)
  9. Large area, few-layer graphene films on arbitrary substrates by chemical vapor deposition. (Nano letters (Print))
  10. Resistivity of Graphene Nanoribbon Interconnects (IEEE Electron Device Letters)

Their papers