Edward J. Nowak

Electrical and Electronic Engineering · 2001–2019

A researcher in the Science corpus: 7 papers; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.

Subfields

Whom Edward J. Nowak trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jordi Suñé

Who trusts Edward J. Nowak overall

  1. Ethan C. Ahn

Papers from Edward J. Nowak's perspective

Ordered by how strongly the researchers Edward J. Nowak trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Six-band k⋅p calculation of the hole mobility in silicon inversion layers: Dependence on surface orientation, strain, and silicon thickness
  2. Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs (IEEE Electron Device Letters)
  3. On the performance limits for Si MOSFETs: a theoretical study
  4. Scaling challenges and device design requirements for high performance sub-50 nm gate length planar CMOS transistors (2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104))
  5. Fabrication and mobility characteristics of ultra-thin strained Si directly on insulator (SSDOI) MOSFETs (IEEE International Electron Devices Meeting 2003)
  6. On experimental determination of carrier velocity in deeply scaled NMOS: how close to the thermal limit? (IEEE Electron Device Letters)
  7. Limits to binary logic switch scaling - a gedanken model (Proceedings of the IEEE)
  8. New physics-based analytic approach to the thin-oxide breakdown statistics (IEEE Electron Device Letters)
  9. Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm (Digest. International Electron Devices Meeting,)
  10. The effective drive current in CMOS inverters (Digest. International Electron Devices Meeting,)

Their papers